The Xradia Versa 520 instrument is designed to provide X-ray tomographic images with up to 600 nm resolution. Complete 3D images without missing wedge of samples up to 14 cm in size are obtained by taking a complete set of projection images while the sample rotates 180 or 360 degrees. The final resolution of the images depends on the exposure time, sample size and total number of projections. High Voltage X-ray source (up to 160kV) allows accurate measurements of highly absorbing samples such as single crystals and metals 

Characteristics 

• X-ray source with 30-160KV and up to 10W output 
• Focal spot 2-4 µm 
• Double projection design (x-ray and optical projection) 
• Optical magnifications of 0.4x, 4x, 20x, 40x 
• Pixel size 0.1-45 µm 
• Field of view up to 14 cm 

Accessories

• Filter wheel with filters between 20-70% 
• Different sample holders 
• Deben CT5000 in-situ testing stage equipped with a 500N load cell and a Peltier heated & cooled jaws with temperature range from -20°C to +160°C
• Flat field detector for fast scanning large samples