Electric transport measuring system (ETMS) is a system for multifunctional electric measurements of different samples under variable conditions. It includes:

• Cryogenic Micromanipulated Probe Station system (Janis Model: ST-500-2-(4CX-6PORTS). The cryostat ST-500-2 includes a 52 mm diameter electrically grounded gold-plated cooper sample holder. The sample chamber has 6 ports, which are connected to the following: four independent Coaxial Low Frequency single-tip probes with replaceable tips; one independent Kelvin probe (Besocke ltd.); and one fiber optic probe for sample spot-like illumination in the UV-visible range. All probes are mounted on micromanipulated X, Y, and Z translation stages, providing total travel: 50 mm (X), 40 mm (Y), and 10 mm (Z-vertical). Each stage is capable of an incremental translation of 12.5 microns with a typical sensitivity of 6 microns.
• Model 336 Automatic Temperature Controller (LakeShore) to measure and control the temperature. Control heaters and calibrated thermometers for active temperature control with a typical stability of 0.05K in the entire temperature range of 5-450 K.
• Turbo pumping station (HiCube 80 Eco Pfeiffer Vacuum GmbH) for vacuum.
• Antivibration set-up: Vibration isolation table, portable ultra-quiet air compressor, and a pump-line vibration isolator.
• Model ST-FHT high-efficiency multi-layer shielded liquid helium (or nitrogen) flexible transfer line with optimized valve and LHe and LN2 Dewars.
• Monoscope Color System with 3.4 μm optical resolution at a maximum magnification of 508X, at an 89 mm working distance. It includes a Monozoom Lens mounted on a vertical boom with vertical and horizontal adjustment: Travel stages with X=50 mm, Y= 50 mm, Z=32 mm travel; 1/3” Hitachi CCD camera: Fiber-optic light source; 18.5” LCD color monitor.
• To create vertical magnetic fields up to 2000 G, the probe station can use 6 ring permanent magnets with a special replaceable electrically isolated sample mount (25 mm diameter).
• Semiconductor Characterization system (Keithley Inc., model 4200-SCS) includes a computer with controlling software (KITE and other programs) and source-measure cards installed; 2 pulse measure units 4225-PMU with 4225-RPM amplifiers, 1 multi-frequency (10 kHz to 10 MHz) impedance measurement card 4200-CVU, and 4 source-measure units SMU-4200 with 4200-PA preamplifiers. Each source-measure card can be connected to any of 4 coaxial low-frequency single-tip probes of the probe station in order to measure the electric transport properties of the sample within the wide current and voltage ranges allowed by the 4200-SCS system.